Filter Results By:

Products

Applications

Manufacturers

Switch Test

Make, break, or change the connection of a circuit.


Showing results: 931 - 945 of 976 items found.

  • Digital ELCB Tester

    6220 EL - Standard Electric Works Co., Ltd

    ● Microprocessor technology ensures high performance accuracy and reliability.● Fully programmable via tactile key pad.● Direct readout of disconnection, time or current.● Voltage measured during test.● Housed in a heavy duty carry case.● Suitable for all industrial, mining and domestic environments.● Display can be customized for special orders.● Indicate voltage and trip Current/Time.● Use binary principle.● True resistor switching.

  • Low-leakage Switch Matrix Family

    Keysight Technologies

    Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test.  Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wafer prober, which limits the ability to perform automated test, or use a switching matrix and probe card, which reduced the analyzer's measurement resolution.  Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested.  This reduces both test time and cost.  Due to the many price/performance points available, Keysight's switching matrix solutions provide the flexibility to choose exactly what your testing needs require, without overspending.

  • Agile Signal Generators (UXG)

    XSeries - Keysight Technologies

    Get a powerful building block, whether you need a dependable LO or a scalable threat simulator More accurately simulate multi-emitter scenarios for radar, EW and antenna test with the fastest switching, phase coherency, and extensive pulse-modulation Test sooner and increase confidence in EW system performance by generating complex signal simulations when you need them Increase the reliability of your test system: the UXG is a slide-in replacement for legacy fast-switching sources

  • LXI Switch and Control Instruments

    L4400 Series - Keysight Technologies

    The Keysight L4400 Series of switches, digital input/output and analog output instruments offer the best tradeoff in size, functionality and test. They are standalone instruments that perform the same function as their companion 34980A-Series plug-in modules. They come with a fully operational programming interface including a web-page for easy control.

  • 40 Channel Single-Ended Multiplexer Module for 34970A/34972A

    34908A - Keysight Technologies

    Use the Keysight 34908A module for the 34970A/34972A Data Acquisition/Switch Unit for the greatest density in common-low applications, such as battery test, component characterization, and benchtop testing. Each module switches 40 one-wire inputs. All two-wire internal measurements except current are supported. The module low connection is isolated from earth and can float up to 300 V.

  • PXIe-4140, 4-Channel Source Measure Unit

    781742-01 - NI

    The PXIe-4140 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4140 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.

  • PXIe-4147, 4-Channel, ±8 V, 3 A Precision PXIe Source Measure Unit

    786888-01 - NI

    PXIe, 4-Channel, ±8 V, 3 A Precision PXI Source Measure Unit - The PXIe-4147 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote four-wire sensing for accurate measurements. The sample rate of the PXIe-4147 can reduce measurement times, capture transient device characteristics, and help you perform current-voltage (I-V) characterization of devices-under-test (DUTs). With a high-speed sequencing engine, you can synchronize SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4147 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.

  • PXIe-4145, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit

    782435-01 - NI

    PXIe, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit - The PXIe-4145 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4145 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4145 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.

  • PXIe-4144, 4-Channel, ±6 V, 500 mA PXI Source Measure Unit

    782432-01 - NI

    PXIe, 4-Channel, ±6 V, 500 mA PXI Source Measure Unit - The PXIe-4144 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4144 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.

  • PXIe Vector Signal Generator: 1 MHz to 3 GHz or 6 GHz

    M9381A - Keysight Technologies

    Choose your RF modulation bandwidth, 40, 100, or 160 MHz, and easily upgrade as test needs change Increase throughput with fastest RF frequency tuning and amplitude switching for high-speed automated test Save space with a compact solution for up to 8x8 MIMO with phase coherence Get up and running quickly with validated application-specific reference solutions Simplify signal creation with Keysight's Signal Studio and Waveform Creator

  • PXI 3A Power MUX BRIC, 12-Channel, 12-Pole

    40-571-303 - Pickering Interfaces Ltd.

    The 40-571 is a Power Multiplexer designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is possible for most configurations, see switching specifications for restrictions). It is ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. It is available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts.

  • PXI 3A Power MUX BRIC, 15-Channel, 16-Pole

    40-571-205 - Pickering Interfaces Ltd.

    The 40-571 is a Power Multiplexer designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is possible for most configurations, see switching specifications for restrictions). It is ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. It is available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts.

  • PXI 3A Power MUX BRIC, 12-Channel, 24-Pole

    40-571-106 - Pickering Interfaces Ltd.

    The 40-571 is a Power Multiplexer designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is possible for most configurations, see switching specifications for restrictions). It is ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. It is available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts.

  • PXI 3A Power MUX BRIC, 16-Channel, 12-Pole

    40-571-304 - Pickering Interfaces Ltd.

    The 40-571 is a Power Multiplexer designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is possible for most configurations, see switching specifications for restrictions). It is ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. It is available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts.

  • PXI 3A Power MUX BRIC, 16-Channel, 6-Pole

    40-571-402 - Pickering Interfaces Ltd.

    The 40-571 is a Power Multiplexer designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is possible for most configurations, see switching specifications for restrictions). It is ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. It is available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts.

Get Help